本公司專業(yè)經(jīng)營(yíng)各類二手進(jìn)口儀器(銷售、租賃、維修、回收等業(yè)務(wù)),成色新,價(jià)格低,技術(shù)先進(jìn)、質(zhì)量可靠、性能穩(wěn)定的優(yōu)良產(chǎn)品。長(zhǎng)期承接銷售、租賃、維修、回收二手高檔儀器, 包括Agilent、HP、Anritsu、Advantest、R/S、/MARCONI等世界知名品牌的網(wǎng)絡(luò)分析儀、頻譜分析儀、綜合測(cè)試儀、數(shù)字通訊測(cè)試儀、高頻信號(hào)源、數(shù)字示波器、天饋線測(cè)試儀、電聲測(cè)試儀,音頻分析儀等二手高頻通訊測(cè)試儀器儀表的銷售及租賃業(yè)務(wù)。如果你遇到困難,我們都將全力以付的為你們提供最佳的方案。
Testing Multi-Radio Devices in ManufacturingSingle devices with multiple radios and wireless standards pose a significant challenge for manufacturing testing. Ordinarily, each standard is tested one after another, and test times and costs balloon upward. The challenge for you is to test multiple radios and standards in the time it now takes you to test one or two, and that’s precisely what LitePoint’s IQ2010 is designed to do.
Before the IQ2010, to test multi-radio devices, most manufacturers relied on separate lines of single-radio test systems. Multi-radio devices are moved from line to line, and inserted again and again. If one is testing four radios and their underlying standards, it may require four lines and four different test systems. So, equipment cost is high, and insertion-damage risk compounds that cost.
LitePoint’s IQ2010 Multicom Test System attacks two key manufacturing-test obstacles: test time and equipment costs. Your test time is affected by the length of individual tests, and by having to do them in a series. The IQ2010 provides you with some test concurrency, which shortens overall test time, and a technology called “sequence-based testing” or SBT, which markedly reduces the number of communications transactions between your tester and device-under-test (DUT). These two features can reduce test time and test cost dramatically.    2010 demo.  And, by having a single system that does the work of four systems, you save on equipment costs.
For more information, see the  brochure  and  datasheet.關(guān)于我們 | 友情鏈接 | 網(wǎng)站地圖 | 聯(lián)系我們 | 最新產(chǎn)品
浙江民營(yíng)企業(yè)網(wǎng) m.peada.cn 版權(quán)所有 2002-2010
浙ICP備11047537號(hào)-1